Testing
Capabilities:
Optical
transmission testbeds from 100Mb/s Ethernet to 160Gb/s.
High-speed
digital testing (Bit Error Rate & Q measurements);
-
NRZ
to 43Gb/s
-
RZ
to 160Gb/s
Picosecond
pulse optical sources and electo-optic sampling (>100Gb/s).
Multiwavelength
optical sources & modulators (DWDM at 1.5µm and 1.3µm).
Optical
jitter generation & measurement.
Analogue
optical transmission.
Radio-on-fibre
and RF optoelectronics.
Optical
packet and optical signal processing testbed.
Optoelectronic
device and component testing including amplifiers, lasers,
modulators, detectors and passive optical devices.
Electrical
measurements: Probe testing of chips and bars and full package
measurements, high speed RF characterisation to 50GHz.
Optical
measurements: Gain, power, PDG & PDL, noise, spectrum,
chirp.
A
PDF version of this Data Sheet is available below (Approx
250kB)
 Optical
Systems Test & Measurement PDF
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Visit CIP at OFC / San Diego, USA / 24-26 March 2009 Booth No 393 more info
CIP Technolgies Launches HyBoard™ Hybrid Photonic Integration Platform at ECOC 2008.
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